Schrimpf, C. : rechercher sur Z-Library

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1

Currency momentum strategies

Lukas Menkhoff, Lucio Sarno, Maik Schmeling, Andreas Schrimpf

Journal:

Journal of Financial Economics

Année:

2012

Langue:

english

Fichier:

PDF, 629 KB

english, 2012

2

Deutsch für Ärztinnen und Ärzte (Trainingsbuch für die Fachsprachprüfung und den klinischen Alltag) ||

Schrimpf, Ulrike, Bahnemann, Markus, Lechner, Martin

Année:

2019

Langue:

german

Fichier:

PDF, 10.94 MB

german, 2019

3

Carry Trades and Global Foreign Exchange Volatility

LUKAS MENKHOFF, LUCIO SARNO, MAIK SCHMELING, ANDREAS SCHRIMPF

Journal:

The Journal of Finance

Année:

2012

Langue:

english

Fichier:

PDF, 445 KB

english, 2012

4

Information Flows in Foreign Exchange Markets: Dissecting Customer Currency Trades

MENKHOFF, LUKAS, SARNO, LUCIO, SCHMELING, MAIK, SCHRIMPF, ANDREAS

Journal:

The Journal of Finance

Année:

2016

Langue:

english

Fichier:

PDF, 800 KB

english, 2016

5

Medicine - Religion - Spirituality (Global Perspectives on Traditional, Complementary, and Alternative Healing) ||

LÃ¼ddeckens, Dorothea, Schrimpf, Monika

Année:

2018

Langue:

english

Fichier:

PDF, 1.42 MB

english, 2018

6

Selection on Moral Hazard in Health Insurance

Einav, Liran, Finkelstein, Amy, Ryan, Stephen P, Schrimpf, Paul, Cullen, Mark R

Journal:

American Economic Review

Année:

2013

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2013

7

ESD effects in power MOSFETs: a review

Dragan Zupac, Ronald D. Schrimpf, Kenneth F. Galloway

Journal:

Microelectronics Journal

Année:

1993

Langue:

english

Fichier:

PDF, 1.06 MB

english, 1993

8

Tragedy and Comedy in the Works of Heinrich von Kleist

Heinrich von Kleist and Hans Joachim Schrimpf

Journal:

Année:

1966

Langue:

english

Fichier:

PDF, 1.76 MB

english, 1966

9

Single event transient effects in a voltage reference

P.C. Adell, R.D. Schrimpf, C.R. Cirba, W.T. Holman, X. Zhu, H.J. Barnaby, O. Mion

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 393 KB

english, 2005

10

Total ionizing dose effects in shallow trench isolation oxides

Federico Faccio, Hugh J. Barnaby, Xiao J. Chen, Daniel M. Fleetwood, Laura Gonella, Michael McLain, Ronald D. Schrimpf

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 281 KB

english, 2008

11

Anaplastic astrocytoma with piloid features, a novel molecular class of IDH wildtype glioma with recurrent MAPK pathway, CDKN2A/B and ATRX alterations

Reinhardt, Annekathrin, Stichel, Damian, Schrimpf, Daniel, Sahm, Felix, Korshunov, Andrey, Reuss, David E., Koelsche, Christian, Huang, Kristin, Wefers, Annika K., Hovestadt, Volker, Sill, Martin, Gra

Journal:

Acta Neuropathologica

Année:

2018

Langue:

english

Fichier:

PDF, 2.47 MB

english, 2018

12

International Diversification Benefits with Foreign Exchange Investment Styles

Kroencke, Tim-Alexander, Schindler, Felix, Schrimpf, Andreas

Journal:

SSRN Electronic Journal

Année:

2011

Langue:

english

Fichier:

PDF, 633 KB

english, 2011

13

Segmented Money Markets and Covered Interest Parity Arbitrage

Rime, Dagfinn, Schrimpf, Andreas, Syrstad, Olav

Journal:

SSRN Electronic Journal

Année:

2017

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2017

14

SEGR: A unique failure mode for power MOSFETs in spacecraft

M. Allenspach, J.R. Brews, K.F. Galloway, G.H. Johnson, R.D. Schrimpf, R.L. Pease, J.L. Titus, C.F. Wheatley

Journal:

Microelectronics Reliability

Année:

1996

Langue:

english

Fichier:

PDF, 296 KB

english, 1996

15

Thermal modeling of single event burnout failure in semiconductor power devices

D.G. Walker, T.S. Fisher, J. Liu, R.D. Schrimpf

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 230 KB

english, 2001

16

A generalized model for the lifetime of microelectronic components, applied to storage conditions

Loren J Wise, Ronald D Schrimpf, Harold G Parks, Kenneth F Galloway

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 227 KB

english, 2001

17

Total dose effects on power-MOSFET switching converters

J.E Pizano, T.H Ma, J.O Attia, R.D Schrimpf, K.F Galloway, A.F Witulski

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 324 KB

english, 1998

18

Muon-Induced Single Event Upsets in Deep-Submicron Technology

Sierawski, Brian D., Mendenhall, Marcus H., Reed, Robert A., Clemens, Michael A., Weller, Robert A., Schrimpf, Ronald D., Blackmore, Ewart W., Trinczek, Michael, Hitti, Bassam, Pellish, Jonathan A., B

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 551 KB

english, 2010

19

[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Neutron and alpha particle-induced transients in 90 nm technology

Narasimham, Balaji, Gadlage, Matthew J., Bhuva, Bharat L., Schrimpf, Ronald D., Massengill, Lloyd W., Holman, W. Timothy, Witulski, Arthur F., Xiaowei Zhu,, Balasubramanian, Anupama, Wender, Steve A.

Année:

2008

Langue:

english

Fichier:

PDF, 273 KB

english, 2008

20

Single-Event Transient Measurements in nMOS and pMOS Transistors in a 65-nm Bulk CMOS Technology at Elevated Temperatures

Gadlage, Matthew J., Ahlbin, Jonathan R., Narasimham, Balaji, Bhuva, Bharat L., Massengill, Lloyd W., Schrimpf, Ronald D.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 991 KB

english, 2011

21

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Single event transient pulse width measurements in a 65-nm bulk CMOS technology at elevated temperatures

Gadlage, M. J., Ahlbin, J. R., Bhuva, B. L., Massengill, L. W., Schrimpf, R. D.

Année:

2010

Langue:

english

Fichier:

PDF, 799 KB

english, 2010

22

Dehydrogenation of defects and hot-electron degradation in GaN high-electron-mobility transistors

Y. S. Puzyrev, T. Roy, M. Beck, B. R. Tuttle, R. D. Schrimpf, D. M. Fleetwood, S. T. Pantelides

Année:

2011

Langue:

english

Fichier:

PDF, 2.35 MB

english, 2011

23

Passivation of ferroelectric PZT capacitors using spin-on-glass

Schifko, J. R., Kneer, E. A., Birnie Iii, D. P., Schrimpf, R. D., Teowee, G.

Journal:

Integrated Ferroelectrics

Année:

1995

Langue:

english

Fichier:

PDF, 422 KB

english, 1995

24

Schicksalsdeutung und -beeinflussung im japanischen Buddhismus der Gegenwart

Schrimpf, Monika

Journal:

Zeitschrift für Religionswissenschaft

Année:

2003

Langue:

german

Fichier:

PDF, 1.94 MB

german, 2003

25

The Response of Drug Expenditure to Nonlinear Contract Design: Evidence from Medicare Part D

Einav, L., Finkelstein, A., Schrimpf, P.

Journal:

Quarterly Journal of Economics

Année:

2015

Langue:

english

Fichier:

PDF, 754 KB

english, 2015

26

[ACM Press Papers presented at the December 1-3, 1959, eastern joint IRE-AIEE-ACM computer conference - Boston, Massachusetts (1959.12.01-1959.12.03)] Papers presented at the December 1-3, 1959, eastern joint IRE-AIEE-ACM computer conference on - IRE-AIEE-ACM '59 (Eastern) - Arithmetic and control techniques in a multiprogram computer

Lourie, N., Schrimpf, H., Reach, R., Kahn, W.

Année:

1959

Langue:

english

Fichier:

PDF, 843 KB

english, 1959

27

Selection on Moral Hazard in Health Insurance

Liran Einav, Amy Finkelstein, Stephen P. Ryan, Paul Schrimpf and Mark R. Cullen

Journal:

American Economic Review

Année:

2013

Langue:

english

Fichier:

PDF, 4.55 MB

english, 2013

28

Deutsch für Pflegekräfte ||

Schrimpf, Ulrike, Becherer, Sabine, Ott, Andrea

Année:

2017

Langue:

german

Fichier:

PDF, 6.77 MB

german, 2017

29

On the Construction of Common Size, Value and Momentum Factors in International Stock Markets: A Guide with Applications

Schmidt, Peter Steffen, von Arx, Urs, Schrimpf, Andreas, Wagner, Alexander F., Ziegler, Andreas

Journal:

SSRN Electronic Journal

Année:

2011

Langue:

english

Fichier:

PDF, 807 KB

english, 2011

30

Segmented Money Markets and Covered Interest Parity Arbitrage

Rime, Dagfinn, Schrimpf, Andreas, Syrstad, Olav

Journal:

SSRN Electronic Journal

Année:

2017

Langue:

english

Fichier:

PDF, 3.67 MB

english, 2017

31

Schriften zur Ästhetik und Poetik (Kritische Ausgabe) || Die Unschuldswelt

Moritz, Karl Philipp, Schrimpf, Hans Joachim

Année:

1962

Fichier:

PDF, 761 KB

1962

32

Record Breaking Optimization Results Using the Ruin and Recreate Principle

Gerhard Schrimpf, Johannes Schneider, Hermann Stamm-Wilbrandt, Gunter Dueck

Journal:

Journal of Computational Physics

Année:

2000

Langue:

english

Fichier:

PDF, 624 KB

english, 2000

33

MOS device degradation due to total dose ionizing radiation in the natural space environment: A review

K.F. Galloway, R.D. Schrimpf

Journal:

Microelectronics Journal

Année:

1990

Langue:

english

Fichier:

PDF, 791 KB

english, 1990

34

Exploration of heavy ion irradiation effects on gate oxide reliability in power MOSFETs

S.R. Anderson, R.D. Schrimpf, K.F. Galloway, J.L. Titus

Journal:

Microelectronics Reliability

Année:

1995

Langue:

english

Fichier:

PDF, 346 KB

english, 1995

35

A method for predicting breakdown voltage of power devices with cylindrical diffused junctions

Francis K Chai, S.L Kosier, R.D Schrimpf, K.F Galloway

Journal:

Solid-State Electronics

Année:

1995

Langue:

english

Fichier:

PDF, 218 KB

english, 1995

36

A lagrangian model of phytoplankton dynamics in the Northwest African coastal upwelling zone

A.J. Gabric, W. Eifler, W. Schrimpf

Journal:

Advances in Space Research

Année:

1996

Langue:

english

Fichier:

PDF, 1.44 MB

english, 1996

37

The sensitivity of radiation-induced leakage to STI topology and sidewall doping

Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 1.10 MB

english, 2011

38

1/f Noise in GaN HEMTs grown under Ga-rich, N-rich, and NH3-rich conditions

Tania Roy, Yevgeniy S. Puzyrev, En Xia Zhang, Sandeepan DasGupta, Sarah A. Francis, Daniel M. Fleetwood, Ronald D. Schrimpf, Umesh K. Mishra, James S. Speck, Sokrates T. Pantelides

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 676 KB

english, 2011

39

Performance, reliability, radiation effects, and aging issues in microelectronics – From atomic-scale physics to engineering-level modeling

Sokrates T. Pantelides, L. Tsetseris, M.J. Beck, S.N. Rashkeev, G. Hadjisavvas, I.G. Batyrev, B.R. Tuttle, A.G. Marinopoulos, X.J. Zhou, D.M. Fleetwood, R.D. Schrimpf

Journal:

Solid-State Electronics

Année:

2010

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2010

40

A model of radiation effects in nitride–oxide films for power MOSFET applications

V.A.K. Raparla, S.C. Lee, R.D. Schrimpf, D.M. Fleetwood, K.F. Galloway

Journal:

Solid-State Electronics

Année:

2003

Langue:

english

Fichier:

PDF, 183 KB

english, 2003

41

Ausnutzung der Zuchterfolge in der Züchtung auf Ertrag durch pflanzenbauliche Maßnahmen

Journal:

Theoretical and Applied Genetics

Année:

1963

Langue:

german

Fichier:

PDF, 616 KB

german, 1963

42

Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs

J.A. Felix, J.R. Schwank, C.R. Cirba, R.D. Schrimpf, M.R. Shaneyfelt, D.M. Fleetwood, P.E. Dodd

Journal:

Microelectronic Engineering

Année:

2004

Langue:

english

Fichier:

PDF, 503 KB

english, 2004

43

Single event burnout in power diodes: Mechanisms and models

A.M. Albadri, R.D. Schrimpf, K.F. Galloway, D.G. Walker

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 281 KB

english, 2006

44

Effects of device aging on microelectronics radiation response and reliability

D.M. Fleetwood, M.P. Rodgers, L. Tsetseris, X.J. Zhou, I. Batyrev, S. Wang, R.D. Schrimpf, S.T. Pantelides

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 1.16 MB

english, 2007

45

Hydrogen in MOSFETs – A primary agent of reliability issues

Sokrates T. Pantelides, L. Tsetseris, S.N. Rashkeev, X.J. Zhou, D.M. Fleetwood, R.D. Schrimpf

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2007

46

Monte Carlo Simulation of Single Event Effects

Weller, Robert A., Mendenhall, Marcus H., Reed, Robert A., Schrimpf, Ronald D., Warren, Kevin M., Sierawski, Brian D., Massengill, Lloyd W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2010

Langue:

english

Fichier:

PDF, 851 KB

english, 2010

47

Evaluation of SEGR threshold in power MOSFETs

Mouret, I., Schrimpf, R.D., Galloway, K.F., Allenspach, M., Brews, J.R.

Journal:

IEEE Transactions on Nuclear Science

Année:

1994

Langue:

english

Fichier:

PDF, 608 KB

english, 1994

48

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Effect of carrier transport in oxides surrounding active devices on SEE in 45nm SOI SRAM

Turowski, Marek, Raman, Ashok, Alles, Michael L., Ball, Dennis, King, Michael P., Reed, Robert A., Schrimpf, Ron D.

Année:

2011

Langue:

english

Fichier:

PDF, 1.38 MB

english, 2011

49

Modeling the Radiation Response of Fully-Depleted SOI n-Channel MOSFETs

Esqueda, I. S., Barnaby, H. J., McLain, M. L., Adell, P. C., Mamouni, F. E., Dixit, S. K., Schrimpf, R. D., Xiong, W.

Journal:

IEEE Transactions on Nuclear Science

Année:

2009

Langue:

english

Fichier:

PDF, 392 KB

english, 2009

50

High fluence 1.8 MeV proton irradiation effects on n-type MOS capacitors

R. Arinero, E.X. Zhang, N. Rezzak, R.D. Schrimpf, D.M. Fleetwood, B.K. Choï, A.B. Hmelo, J. Mekki, A.D. Touboul, F. Saigné

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 561 KB

english, 2011